The surface properties of PS/PMMA blends nanostructured polymeric layers

被引：21

作者：

Prosycevas, I

Tamulevicius, S

Guobiene, A

机构：

[1] Kaunas Univ Technol, Inst Phys Elect, LT-3009 Kaunas, Lithuania

[2] Kaunas Univ Technol, Dept Phys, LT-3031 Kaunas, Lithuania

来源：

THIN SOLID FILMS | 2004年 / 453卷

关键词：

polystyrene; polymethylmethacrylate; solution; sorption; thin films; nanostructurization;

D O I：

10.1016/j.tsf.2003.11.090

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Solvent cast thin films of blends polystyrene (PS) and poly (methylmethacrylate) (PMMA) with nominal compositions ranging from 25/75 wt.%/v% (w/v) up to 75/25 w/v PS/PMMA with toluene as the mutual solvent on crystalline Si (100) and silica substrates has been studied. Films of PS and PMMA blends have been examined by atomic force microscopy (AFM) and ellipsometry. The blend films with less than 50% PMMA bulk concentration generally exhibit pitted surfaces; the pit size varies with film thickness and bulk composition. When the PMMA bulk concentration is greater than 50%, the film surface can be described as island-like phase-separated structure. The surface segregation and morphology are explained in terms of solubility of the two polymers in the solvent and rewetting of PMMA relative to PS. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：304 / 311

页数：8

共 15 条

[1] MISCIBILITY OF BISPHENOL-A POLYCARBONATE WITH POLY(METHYL METHACRYLATE) [J].