Low critical current for spin transfer in magnetic tunnel junctions

被引:33
作者
Meng, H
Wang, J
Wang, JP
机构
[1] Univ Minnesota, Ctr Micromagnet & Informat Technol, MINT, Minneapolis, MN 55455 USA
[2] Univ Minnesota, Dept Elect & Comp Engn, Minneapolis, MN 55455 USA
关键词
D O I
10.1063/1.2179124
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report a novel approach to reduce the critical current density for spin transfer in nanoscale magnetic tunnel junction (MTJ) structures. By integrating a spin valve and a MTJ structure with antiparallel pinned layers, the dc critical switching current density is reduced by one order of magnitude (2x10(6) A/cm(2)) at room temperature. The magnetoresistive (MR) properties of the MTJ + spin-valve device are dominated by the MTJ layers. The MR ratio is 15.8% with resistance area product of 4.5 Omega mu m(2). This demonstration opens a window for high-density magnetic random access memory design. (c) 2006 American Institute of Physics.
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页数:3
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