Intrinsic ferroelectric properties of strained tetragonal PbZr0.2Ti0.8O3 obtained on layer-by-layer grown, defect-free single-crystalline films

被引：239

作者：

Vrejoiu, Ionela ^{[1
]}

Le Rhun, Gwenael ^{[1
]}

Pintilie, Lucian ^{[1
]}

Hesse, Dietrich ^{[1
]}

Alexe, Marin ^{[1
]}

Goesele, Ulrich ^{[1
]}

机构：

[1] Max Planck Inst Microstruct Phys, D-06120 Halle, Germany

来源：

ADVANCED MATERIALS | 2006年 / 18卷 / 13期

关键词：

D O I：

10.1002/adma.200502711

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Ferroelectric single-crystalline PbZr0.2Ti0.8O3 thin films, free from extended defects, are grown by pulsed laser deposition onto vicinal SrTiO3(001) single crystals. The PbZr0.2Ti0.8O3 films are strained and exhibit enhanced tetragonality, c/a approximate to 1.06. They have a remnant polarization, P-r = 110 mu C cm(-2), dielectric constant, 633 = 90, and piezoelectric coefficient, d(33), up to 50 pm V-1 (see figure).

引用

页码：1657 / +

页数：6

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