Topological Quantum Image Analysis

被引：0
|
作者：
Chapline, George [1 ]
DuBois, Jonathan L. [1 ]
机构：
[1] Lawrence Livermore Natl Lab, Livermore, CA 94551 USA
来源：
QUANTUM INFORMATION AND COMPUTATION VII | 2009年 / 7342卷
关键词：
topological quantum computing; image analysis; topological insulators; MECHANICS;
D O I：
10.1117/12.817053
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A new approach to analyzing visual images is proposed, based on the idea of converting an optical image into a spatially varying pattern of polarized squeezed light, which is then used to produce a pattern of chiral edge currents in a thin film topological insulator. Thin films of Bi or Bi doped with Sb which are punctured with an array of sub-micron holes may be a way of realizing this kind of optical quantum information processing.
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页数：6
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