Clock Distribution Networks for 3-D Integrated Circuits

被引:29
作者
Pavlidis, Vasilis F. [1 ]
Savidis, Ioannis [1 ]
Friedman, Eby G. [1 ]
机构
[1] Univ Rochester, Dept Elect & Comp Engn, Rochester, NY 14627 USA
来源
PROCEEDINGS OF THE IEEE 2008 CUSTOM INTEGRATED CIRCUITS CONFERENCE | 2008年
关键词
D O I
10.1109/CICC.2008.4672170
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Three-dimensional (3-D) integration is an important technology that addresses fundamental limitations of on-chip interconnects. Several design issues related to 3-D circuits, such as multi-plane synchronization, however, need to be addressed. A comparison of three 3-D clock distribution network topologies is presented in this paper. Experimental results of a 3-D test circuit manufactured by the MIT Lincoln Laboratories are also described. Successful operation of the 3-D test circuit at 1.4 GHz is demonstrated. Clock skew and power dissipation measurements for the different clock topologies are also provided.
引用
收藏
页码:651 / 654
页数:4
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