Electrodeposited cobalt plus copper thin films on ITO substrata

被引:33
作者
Gómez, E
Labarta, A
Llorente, A
Vallés, E
机构
[1] Univ Barcelona, Lab Ciencia & Tecnol Electroquim Mat, Fac Quim, Dept Quim Fis, E-08028 Barcelona, Spain
[2] Univ Barcelona, Fac Fis, Dept Fis Fonamental, E-08028 Barcelona, Spain
关键词
electrodeposition; cobalt plus copper alloy; indium tin oxide; magnetoresistance;
D O I
10.1016/S0022-0728(01)00670-2
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Cobalt + copper thin films with variable composition were obtained over indium-tin oxide covered glass plates (ITO) by means of electrodeposition, from a citrate bath upon varying both the [Co(II)]/[Cu(II)] ratio in solution and the deposition conditions. The ITO/glass substrate is sufficiently conductive to allow electrodeposition. directly onto it, and also allows the measurement of the magnetoresistance without separating the films. The electrochemical and structural analyses indicated that a solid solution is formed in the electrodeposition conditions studied, although TEM analysis showed the random distribution of nanometric dense particles of cobalt distributed within the deposits. These particles were responsible for the magnetoresistance (MR) signal which was observed for all the Co + Cu films. The MR value increased when the cobalt percentage increased in the deposit. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:63 / 68
页数:6
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