Susceptibility of lithium-niobate modulator to high-power microwave pulses

被引：3

作者：

Bucholtz, F. ^{[1
]}

Villarruel, C. A. ^{[1
]}

Knapp, P. F. ^{[2
]}

Shue, J. ^{[4
]}

Andreadis, T. D. ^{[4
]}

Schermer, R. T. ^{[3
]}

Gil, J. Gil ^{[4
]}

Williams, K. J. ^{[1
]}

机构：

[1] Naval Res Lab, Div Opt Sci, Washington, DC USA

[2] SFA Inc, Dept Elect & Comp Engn, Crofton, MD USA

[3] Global Strategies Grp Inc, Crofton, MD USA

[4] Naval Res Lab, Tact Elect Warfare Div, Washington, DC USA

来源：

ELECTRONICS LETTERS | 2009年 / 45卷 / 05期

关键词：

D O I：

10.1049/el:20090009

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The. first measurement of the susceptibility of an off-the-shelf lithiumniobate intensity modulator to damage and disruption from high-power microwave pulses is reported. The device tested survived 1 kHz repetition rate pulses at 2.5 GHz centre frequency and 40 mu s width up to 200 W peak power. The results are discussed in terms of material parameters and device characteristics.

引用

页码：272 / U50

页数：2

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