Susceptibility of lithium-niobate modulator to high-power microwave pulses

被引：3
|
作者：
Bucholtz, F. [1 ]
Villarruel, C. A. [1 ]
Knapp, P. F. [2 ]
Shue, J. [4 ]
Andreadis, T. D. [4 ]
Schermer, R. T. [3 ]
Gil, J. Gil [4 ]
Williams, K. J. [1 ]
机构：
[1] Naval Res Lab, Div Opt Sci, Washington, DC USA
[2] SFA Inc, Dept Elect & Comp Engn, Crofton, MD USA
[3] Global Strategies Grp Inc, Crofton, MD USA
[4] Naval Res Lab, Tact Elect Warfare Div, Washington, DC USA
来源：
ELECTRONICS LETTERS | 2009年 / 45卷 / 05期
关键词：
D O I：
10.1049/el:20090009
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The. first measurement of the susceptibility of an off-the-shelf lithiumniobate intensity modulator to damage and disruption from high-power microwave pulses is reported. The device tested survived 1 kHz repetition rate pulses at 2.5 GHz centre frequency and 40 mu s width up to 200 W peak power. The results are discussed in terms of material parameters and device characteristics.
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页码：272 / U50
页数：2
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