The Rosetta experiment: Atmospheric soft error rate testing in differing technology FPGAs

被引：140

作者：

Lesea, A ^{[1
]}

Drimer, S ^{[1
]}

Fabula, JJ ^{[1
]}

Carmichael, C ^{[1
]}

Alfke, P ^{[1
]}

机构：

[1] Xillinx, San Jose, CA 95124 USA

来源：

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 2005年 / 5卷 / 03期

关键词：

cosmic rays; FPGA; NSEU; single-event upset; soft error; SRAM;

D O I：

10.1109/TDMR.2005.854207

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Results are presented from real-time experiments that evaluated large field programmable gate arrays (FPGAs) fabricated in different CMOS technologies (0.15 mu m, 0.13 mu m, and 90 nm) for their sensitivity to radiation-induced single-event upsets (SEUs). These results are compared to circuit simulation (Qcrit) studies as well as to Los Alamos Neutron Science Center (LANSCE) neutron beam results and Crocker Nuclear Laboratory (University of California, Davis) cyclotron proton beam results.

引用

页码：317 / 328

页数：12