High-resolution X-ray imaging with samarium-doped fluoroaluminate and fluorophosphate glass

被引:27
作者
Edgar, A. [1 ,2 ]
Varoy, C. R. [1 ]
Koughia, C. [3 ]
Okada, G. [3 ]
Belev, G. [4 ]
Kasap, S. [3 ]
机构
[1] Victoria Univ Wellington, Sch Chem & Phys Sci, Wellington, New Zealand
[2] Victoria Univ Wellington, MacDiarmid Inst, Wellington, New Zealand
[3] Univ Saskatchewan, Dept Elect & Comp Engn, Saskatoon, SK S7N 0X4, Canada
[4] Univ Saskatchewan, Canadian Light Source Inc, Saskatoon, SK S7N 0X4, Canada
关键词
Samarium-doped glass; Fluorophosphate glass; Fluoroaluminate glass; Valence conversion; Dosimetly; RADIATION-INDUCED DEFECTS; PHOSPHATE; IONS;
D O I
10.1016/j.jnoncrysol.2012.12.022
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We report the use of samarium-doped (Sm3+) fluoroaluminate and fluorophosphate glasses for X-ray imaging. Incident X-rays convert samarium ions from the trivalent to the divalent state on a semi-permanent but erasable basis. Of the three fluorophosphate glass compositions investigated, that with the smallest fraction of phosphate bonds showed the greatest conversion, but fluoroaluminate glass showed better conversion than any of them. The effects of polyvalent co-dopants Ce, Eu, Pb, Sn, and In, (which may potentially act as electron donors or acceptors) on the conversion efficiency were investigated in fluoroaluminate glass, and whilst In and Sn inhibit the conversion, none of the co-dopants produced significant enhancement. The valence conversion may be used for X-ray imaging through the photoluminescence of the X-ray generated Sm2+ ions. With an optimal choice of the excitation wavelength and appropriate optical filtration in the camera-based recording system, very high-resolution X-ray imaging can be achieved. Recorded images show resolved detail down to the level of 25 mu m, and the measured modulation transfer function extends out to 11 line pairs/mm. (c) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:124 / 128
页数:5
相关论文
共 18 条
[1]   Valency conversion of samarium ions under high dose synchrotron generated X-ray radiation [J].
Belev, George ;
Okada, Go ;
Tonchev, Dancho ;
Koughia, Cyril ;
Varoy, Chris ;
Edgar, Andy ;
Wysokinski, Tomasz ;
Chapman, Dean ;
Kasap, Safa .
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 8, NO 9, 2011, 8 (09) :2822-2825
[2]   On the formation of paramagnetic defects in ion-implanted fluoroaluminate glasses [J].
Bogomolova, LD ;
Teplyakov, YG ;
Jachkin, VA ;
Bogdanov, VL ;
Khalilev, VD ;
Caccavale, F ;
LoRusso, S .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1996, 202 (1-2) :178-184
[3]   EPR OF RADIATION-INDUCED DEFECTS IN FLUOROALUMINATE GLASSES [J].
BOGOMOLOVA, LD ;
KRASILNIKOVA, NA ;
TRUL, OA ;
BOGDANOV, VL ;
KHALILEV, VD ;
PANFILOV, KV ;
CACCAVALE, F .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1994, 175 (01) :84-90
[4]   X-ray induced effects in phosphate glasses [J].
Ebeling, P ;
Ehrt, D ;
Friedrich, M .
OPTICAL MATERIALS, 2002, 20 (02) :101-111
[5]   Effect of europium ions on X-ray-induced defect formation in phosphate containing glasses [J].
Ebendorff-Heidepriem, H ;
Ehrt, D .
OPTICAL MATERIALS, 2002, 19 (03) :351-363
[6]   Effect of Tb3+ ions on X-ray-induced defect formation in phosphate containing glasses [J].
Ebendorff-Heidepriem, H ;
Ehrt, D .
OPTICAL MATERIALS, 2002, 18 (04) :419-430
[7]  
EBENDORFFHEIDEP.H, 1999, PHOSPHORUS RES B, V10, P552
[8]   UV Transmission and radiation-induced defects in phosphate and fluoride-phosphate glasses [J].
Ehrt, D ;
Ebeling, P ;
Natura, U .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2000, 263 (1-4) :240-250
[9]   FUNDAMENTAL DEFECT CENTERS IN GLASS - ELECTRON-SPIN RESONANCE AND OPTICAL-ABSORPTION STUDIES OF IRRADIATED PHOSPHORUS-DOPED SILICA GLASS AND OPTICAL FIBERS [J].
GRISCOM, DL ;
FRIEBELE, EJ ;
LONG, KJ ;
FLEMING, JW .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (07) :3743-3762
[10]   4f6→4f55d1 absorption spectrum analysis of Sm2+:SrCl2 [J].
Karbowiak, Miroslaw ;
Urbanowicz, Agnieszka ;
Reid, Michael F. .
PHYSICAL REVIEW B, 2007, 76 (11)