共 34 条
[14]
Windowed Fourier transform for fringe pattern analysis
[J].
APPLIED OPTICS,
2004, 43 (13)
:2695-2702
[15]
Kemao QA, 2008, APPL OPTICS, V47, P5420, DOI [10.1364/AO.47.005408, 10.1364/AO.47.005420]
[17]
Phase Measuring Deflectometry:: a new approach to measure specular free-form surfaces
[J].
OPTICAL METROLOGY IN PRODUCTION ENGINEERING,
2004, 5457
:366-376