Coherent x-ray diffraction imaging with nanofocused illumination

被引:130
作者
Schroer, C. G. [1 ]
Boye, R. [1 ]
Feldkamp, J. M. [1 ]
Patommel, J. [1 ]
Schropp, A. [1 ,3 ]
Schwab, A. [1 ]
Stephan, S. [1 ]
Burghammer, M. [2 ]
Schoeder, S. [2 ]
Riekel, C. [2 ]
机构
[1] Tech Univ Dresden, Inst Struct Phys, D-01062 Dresden, Germany
[2] ESRF, F-38043 Grenoble, France
[3] DESY, HASYLAB, D-22607 Hamburg, Germany
关键词
D O I
10.1103/PhysRevLett.101.090801
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Coherent x-ray diffraction imaging is an x-ray microscopy technique with the potential of reaching spatial resolutions well beyond the diffraction limits of x-ray microscopes based on optics. However, the available coherent dose at modern x-ray sources is limited, setting practical bounds on the spatial resolution of the technique. By focusing the available coherent flux onto the sample, the spatial resolution can be improved for radiation-hard specimens. A small gold particle (size <100 nm) was illuminated with a hard x-ray nanobeam (E = 15.25 keV, beam dimensions - 100 X 100 nm(2)) and is reconstructed from its coherent diffraction pattern. A resolution of about 5 nm is achieved in 600 s exposure time.
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页数:4
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