A Systematic Error in X-ray Grating Interferometry due to Asymmetric Scattering Distributions

被引:4
作者
Modregger, Peter [1 ]
Pinzer, Bernd Rudolf [1 ]
Stampanoni, Marco [1 ]
机构
[1] Paul Scherrer Inst, Swiss Light Source, Villigen, Switzerland
来源
INTERNATIONAL WORKSHOP ON X-RAY AND NEUTRON PHASE IMAGING WITH GRATINGS | 2012年 / 1466卷
关键词
grating interferometry; x-ray imaging; data analysis; systematic errors;
D O I
10.1063/1.4742306
中图分类号
O59 [应用物理学];
学科分类号
摘要
The high sensitivity provided by x-ray grating interferometry is one of the distinct characteristics of this phase contrast imaging technique. Up to now, several contributions to the uncertainty of the determined phase signal are known, which can be addressed by adapting total acquisition time or improving the mechanics of the experimental setup. Here, we demonstrate the occurrence of an additional systematic error, which is intrinsic to the physics of the contrast formation process. Based on a recently established scattering-based description of grating interferometry, we demonstrate analytically that asymmetric scattering distributions lead to a systematic error in the determined phase signal.
引用
收藏
页码:288 / 292
页数:5
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