Electric-field-induced interfacial instabilities of a soft elastic membrane confined between viscous layers
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作者:
Dey, Mohar
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Yeungnam Univ, Sch Mech Engn, Gyongsan 712749, South KoreaYeungnam Univ, Sch Mech Engn, Gyongsan 712749, South Korea
Dey, Mohar
[1
]
Bandyopadhyay, Dipankar
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Indian Inst Technol Guwahati, Dept Chem Engn, Gauhati 781039, Assam, IndiaYeungnam Univ, Sch Mech Engn, Gyongsan 712749, South Korea
Bandyopadhyay, Dipankar
[2
]
Sharma, Ashutosh
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Yeungnam Univ, Sch Mech Engn, Gyongsan 712749, South Korea
Indian Inst Technol, Dept Chem Engn, Kanpur 208016, UP, IndiaYeungnam Univ, Sch Mech Engn, Gyongsan 712749, South Korea
Sharma, Ashutosh
[1
,3
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Qian, Shizhi
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Yeungnam Univ, Sch Mech Engn, Gyongsan 712749, South Korea
Old Dominion Univ, Inst Micro Nanotechnol, Norfolk, VA 23529 USAYeungnam Univ, Sch Mech Engn, Gyongsan 712749, South Korea
Qian, Shizhi
[1
,4
]
Joo, Sang Woo
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Yeungnam Univ, Sch Mech Engn, Gyongsan 712749, South KoreaYeungnam Univ, Sch Mech Engn, Gyongsan 712749, South Korea
Joo, Sang Woo
[1
]
机构:
[1] Yeungnam Univ, Sch Mech Engn, Gyongsan 712749, South Korea
[2] Indian Inst Technol Guwahati, Dept Chem Engn, Gauhati 781039, Assam, India
[3] Indian Inst Technol, Dept Chem Engn, Kanpur 208016, UP, India
[4] Old Dominion Univ, Inst Micro Nanotechnol, Norfolk, VA 23529 USA
We explore the electric-field-induced interfacial instabilities of a trilayer composed of a thin elastic film confined between two viscous layers. A linear stability analysis (LSA) is performed to uncover the growth rate and length scale of the different unstable modes. Application of a normal external electric field on such a configuration can deform the two coupled elastic-viscous interfaces either by an in-phase bending or an antiphase squeezing mode. The bending mode has a long-wave nature, and is present even at a vanishingly small destabilizing field. In contrast, the squeezing mode has finite wave-number characteristics and originates only beyond a threshold strength of the electric field. This is in contrast to the instabilities of the viscous films with multiple interfaces where both modes are found to possess long-wave characteristics. The elastic film is unstable by bending mode when the stabilizing forces due to the in-plane curvature and the elastic stiffness are strong and the destabilizing electric field is relatively weak. In comparison, as the electric field increases, a subdominant squeezing mode can also appear beyond a threshold destabilizing field. A dominant squeezing mode is observed when the destabilizing field is significantly strong and the elastic films are relatively softer with lower elastic modulus. In the absence of liquid layers, a free elastic film is also found to be unstable by long-wave bending and finite wave-number squeezing modes. The LSA asymptotically recovers the results obtained by the previous formulations where the membrane bending elasticity is approximately incorporated as a correction term in the normal stress boundary condition. Interestingly, the presence of a very weak stabilizing influence due to a smaller interfacial tension at the elastic-viscous interfaces opens up the possibility of fabricating submicron patterns exploiting the instabilities of a trilayer.
机构:
Harvard Univ, John A Paulson Sch Engn & Appl Sci, 29 Oxford St, Cambridge, MA 02138 USA
Solchroma Technol Inc, Somerville, MA 02143 USAHarvard Univ, John A Paulson Sch Engn & Appl Sci, 29 Oxford St, Cambridge, MA 02138 USA
Shian, Samuel
Kjeer, Peter
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Harvard Univ, John A Paulson Sch Engn & Appl Sci, 29 Oxford St, Cambridge, MA 02138 USAHarvard Univ, John A Paulson Sch Engn & Appl Sci, 29 Oxford St, Cambridge, MA 02138 USA
Kjeer, Peter
Clarke, David R.
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Harvard Univ, John A Paulson Sch Engn & Appl Sci, 29 Oxford St, Cambridge, MA 02138 USAHarvard Univ, John A Paulson Sch Engn & Appl Sci, 29 Oxford St, Cambridge, MA 02138 USA