Mixing effect of hole-injecting and hole-transporting materials on the performance and lifetime of organic light-emitting devices

被引：14
作者：
Kim, Y
Oh, E
Lim, H
Ha, CS
机构：
[1] Univ London Imperial Coll Sci & Technol, Blackett Lab, Dept Phys, Expt Solid State Phys Grp, London SW7 2BW, England
[2] Ness Display Corp, Kyonggi Do 449860, South Korea
[3] NESS Ctr, Inst Adv Engn, Kyonggi Do 449860, South Korea
[4] Pusan Natl Univ, Dept Polymer Sci & Engn, Pusan 609735, South Korea
来源：
APPLIED PHYSICS LETTERS | 2006年 / 88卷 / 04期
关键词：
D O I：
10.1063/1.2168014
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A hole-injecting-transporting layer (HITL), which was prepared by in situ mixing hole-injecting and hole-transporting (HTM) materials upon evaporating in vacuum, has been attempted to reduce the number of organic layers in organic light-emitting devices (OLEDs). OLEDs with HITLs showed lower current density and luminance than those with hole-injecting layer only or hole-transporting layer only, which is attributed to the charge transport change controlled by the HITL nanomorphology made upon mixing. The highest efficiency and the longest lifetime were achieved for the OLED having the HITL with 25% HTM content, while the OLED with HTM only exhibited very poor device lifetime despite the highest efficiency.
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页码：1 / 3
页数：3
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