Structure-dependent mixed valence of Sm on Cu(111) studied by XPS and STM

被引：12

作者：

Nakayama, Y ^{[1
]}

Kondoh, H ^{[1
]}

Ohta, T ^{[1
]}

机构：

[1] Univ Tokyo, Grad Sch Sci, Dept Chem, Bunkyo Ku, Tokyo 1130033, Japan

来源：

SURFACE SCIENCE | 2004年 / 552卷 / 1-3期

关键词：

lanthanides; copper; X-ray photoelectron spectroscopy; scanning tunneling microscopy; low energy electron diffraction (LEED); growth; surface structure; morphology; roughness and topography; surface electronic phenomena (work function; surface potential; surface states; etc.);

D O I：

10.1016/j.susc.2004.01.020

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Geometric and electronic structures of adsorbed Sm on Cu(111) were studied by scanning tunneling microscopy (STM) and X-ray photoelectron spectroscopy (XPS). The surface morphology and Sm valency change with the Sm coverage, suggesting that Sm atoms in the islands have a valence of approximately 2.7 and those diffusing are divalent. Heating the adlayers yields surface alloy and close-packed overlayer of Sm depending on the coverage and temperature. Atomically resolved STM images indicate that the surface of the alloy phase is not rigid. The closed packed overlayer of a mixed valence Sm is observed as a uniform atomic species. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：53 / 62

页数：10

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