Retroreflection of Optical Radiation from Ellipsoidal-Porous Surfaces

被引：0
作者：
Klass, E. V. [1 ]
机构：
[1] Mendeleev Cent Res Inst Chem & Mech, Moscow 115487, Russia
来源：
OPTICS AND SPECTROSCOPY | 2017年 / 123卷 / 06期
关键词：
LIGHT-SCATTERING; REFLECTION; BACKSCATTERING; MODEL;
D O I：
10.1134/S0030400X1711011X
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The retroreflection of optical radiation from surfaces with roughness in the form of ellipsoidal pores and two-level roughness in the form of convex ellipsoids with elliptical-porous surfaces is studied using the ROKS-RG Monte-Carlo method software in the geometrical-optics approximation. The dependence of the retroreflection phase function on the parameters of bodies that simulates the rough surface is analyzed. It is shown that the angular dependence of the retroreflection from porous rough surfaces with arbitrarily oriented pores and the aspect ratio higher than unity is a pronounced peak with concave sides at all incidence angles.
引用
收藏
页码：977 / 982
页数：6
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