Shear strength and fracture mechanism for full Cu-Sn IMCs solder joints with different Cu3Sn proportion and joints with conventional interfacial structure in electronic packaging

被引:25
作者
Yao, Peng [1 ]
Li, Xiaoyan [1 ]
Han, Xu [1 ]
Xu, Liufeng [1 ]
机构
[1] Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China
基金
北京市自然科学基金; 中国国家自然科学基金;
关键词
Shear strength; Conventional interfacial structure; Cu3Sn proportion; Fracture mechanism; Full Cu-Sn IMCs joints; INTERMETALLIC COMPOUNDS; MICROSTRUCTURE EVOLUTION; SN-3.0AG-0.5CU SOLDER; ELASTIC PROPERTIES; BEHAVIOR; GROWTH; CU6SN5; COMPOUND; SIZE; INTERCONNECTS;
D O I
10.1108/SSMT-06-2018-0018
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Purpose This study aims to analyze the shear strength and fracture mechanism of full Cu-Sn IMCs joints with different Cu3Sn proportion and joints with the conventional interfacial structure in electronic packaging. Design/methodology/approach The Cu-Sn IMCs joints with different Cu3Sn proportion were fabricated through soldering Cu-6 mu m Sn-Cu sandwich structure under the extended soldering time and suitable pressure. The joints of conventional interfacial structure were fabricated through soldering Cu-100 mu m Sn-Cu sandwich structure. After the shear test was conducted, the fracture mechanism of different joints was studied through observing the cross-sectional fracture morphology and top-view fracture morphology of sheared joints. Findings The strength of joints with the conventional interfacial structure was 26.6 MPa, while the strength of full Cu-Sn IMCs joints with 46.7, 60.6, 76.7 and 100 per cent Cu3Sn was, respectively, 33.5, 39.7, 45.7 and 57.9 MPa. The detailed reason for the strength of joints showing such regularity was proposed. For the joint of conventional interfacial structure, the microvoids accumulation fracture happened within the Sn solder. However, for the full Cu-Sn IMCs joint with 46.7 per cent Cu3Sn, the cleavage fracture happened within the Cu6Sn5. As the Cu3Sn proportion increased to 60.6 per cent, the inter-granular fracture, which resulted in the interfacial delamination of Cu3Sn and Cu6Sn5, occurred along the Cu3Sn/Cu6Sn5 interface, while the cleavage fracture happened within the Cu6Sn5. Then, with the Cu3Sn proportion increasing to 76.7 per cent, the cleavage fracture happened within the Cu6Sn5, while the transgranular fracture happened within the Cu3Sn. The inter-granular fracture, which led to the interfacial delamination of Cu3Sn and Cu, happened along the Cu/Cu3Sn interface. For the full Cu3Sn joint, the cleavage fracture happened within the Cu3Sn. Originality/value The shear strength and fracture mechanism of full Cu-Sn IMCs joints was systematically studied. A direct comparison regarding the shear strength and fracture mechanism between the full Cu-Sn IMCs joints and joints with the conventional interfacial structure was conducted.
引用
收藏
页码:6 / 19
页数:14
相关论文
共 52 条
  • [11] Deformation behavior of (Cu, Ag)-Sn intermetallics by nanoindentation
    Deng, X
    Chawla, N
    Chawla, KK
    Koopman, M
    [J]. ACTA MATERIALIA, 2004, 52 (14) : 4291 - 4303
  • [12] Wafer bonding using Cu-Sn intermetallic bonding layers
    Floetgen, C.
    Pawlak, M.
    Pabo, E.
    van de Wiel, H. J.
    Hayes, G. R.
    Dragoi, V.
    [J]. MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2014, 20 (4-5): : 653 - 662
  • [13] Parametric Study on Pressureless Sintering of Nanosilver Paste to Bond Large-Area (aparts per thousandyen100 mm2) Power Chips at Low Temperatures for Electronic Packaging
    Fu, Shancan
    Mei, Yunhui
    Li, Xin
    Ning, Puqi
    Lu, Guo-Quan
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2015, 44 (10) : 3973 - 3984
  • [14] Investigation on the effect of Sn grain number and orientation on the low cycle fatigue deformation behavior of SnAgCu/Cu solder joints
    Gao, Ruiting
    Li, Xiaoyan
    Zhu, Yongxin
    [J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2015, 26 (04) : 2175 - 2180
  • [15] Phase stability, phase transformations, and elastic properties of Cu6Sn5:: Ab initio calculations and experimental results
    Ghosh, G
    Asta, M
    [J]. JOURNAL OF MATERIALS RESEARCH, 2005, 20 (11) : 3102 - 3117
  • [16] Elastic properties, hardness, and indentation fracture toughness of intermetallics relevant to electronic packaging
    Ghosh, G
    [J]. JOURNAL OF MATERIALS RESEARCH, 2004, 19 (05) : 1439 - 1454
  • [17] Phase transformation and grain orientation of Cu-Sn intermetallic compounds during low temperature bonding process
    Hang, Chunjin
    Tian, Yanhong
    Zhang, Rui
    Yang, Dongsheng
    [J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2013, 24 (10) : 3905 - 3913
  • [18] Microstructure evolution and shear fracture behavior of aged Sn3Ag0. 5Cu/Cu solder joints
    Hu, Xiaowu
    Xu, Tao
    Keer, Leon M.
    Li, Yulong
    Jiang, Xiongxin
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2016, 673 : 167 - 177
  • [19] Microstructure and shear strength of Sn37Pb/Cu solder joints subjected to isothermal aging
    Hu, Xiaowu
    Li, Yulong
    Liu, Yong
    Liu, Yi
    Min, Zhixian
    [J]. MICROELECTRONICS RELIABILITY, 2014, 54 (08) : 1575 - 1582
  • [20] Mechanical properties of Pb-free SnAg solder joints
    Keller, J.
    Baither, D.
    Wilke, U.
    Schmitz, G.
    [J]. ACTA MATERIALIA, 2011, 59 (07) : 2731 - 2741