Shear strength and fracture mechanism for full Cu-Sn IMCs solder joints with different Cu3Sn proportion and joints with conventional interfacial structure in electronic packaging

被引:25
作者
Yao, Peng [1 ]
Li, Xiaoyan [1 ]
Han, Xu [1 ]
Xu, Liufeng [1 ]
机构
[1] Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China
基金
北京市自然科学基金; 中国国家自然科学基金;
关键词
Shear strength; Conventional interfacial structure; Cu3Sn proportion; Fracture mechanism; Full Cu-Sn IMCs joints; INTERMETALLIC COMPOUNDS; MICROSTRUCTURE EVOLUTION; SN-3.0AG-0.5CU SOLDER; ELASTIC PROPERTIES; BEHAVIOR; GROWTH; CU6SN5; COMPOUND; SIZE; INTERCONNECTS;
D O I
10.1108/SSMT-06-2018-0018
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Purpose This study aims to analyze the shear strength and fracture mechanism of full Cu-Sn IMCs joints with different Cu3Sn proportion and joints with the conventional interfacial structure in electronic packaging. Design/methodology/approach The Cu-Sn IMCs joints with different Cu3Sn proportion were fabricated through soldering Cu-6 mu m Sn-Cu sandwich structure under the extended soldering time and suitable pressure. The joints of conventional interfacial structure were fabricated through soldering Cu-100 mu m Sn-Cu sandwich structure. After the shear test was conducted, the fracture mechanism of different joints was studied through observing the cross-sectional fracture morphology and top-view fracture morphology of sheared joints. Findings The strength of joints with the conventional interfacial structure was 26.6 MPa, while the strength of full Cu-Sn IMCs joints with 46.7, 60.6, 76.7 and 100 per cent Cu3Sn was, respectively, 33.5, 39.7, 45.7 and 57.9 MPa. The detailed reason for the strength of joints showing such regularity was proposed. For the joint of conventional interfacial structure, the microvoids accumulation fracture happened within the Sn solder. However, for the full Cu-Sn IMCs joint with 46.7 per cent Cu3Sn, the cleavage fracture happened within the Cu6Sn5. As the Cu3Sn proportion increased to 60.6 per cent, the inter-granular fracture, which resulted in the interfacial delamination of Cu3Sn and Cu6Sn5, occurred along the Cu3Sn/Cu6Sn5 interface, while the cleavage fracture happened within the Cu6Sn5. Then, with the Cu3Sn proportion increasing to 76.7 per cent, the cleavage fracture happened within the Cu6Sn5, while the transgranular fracture happened within the Cu3Sn. The inter-granular fracture, which led to the interfacial delamination of Cu3Sn and Cu, happened along the Cu/Cu3Sn interface. For the full Cu3Sn joint, the cleavage fracture happened within the Cu3Sn. Originality/value The shear strength and fracture mechanism of full Cu-Sn IMCs joints was systematically studied. A direct comparison regarding the shear strength and fracture mechanism between the full Cu-Sn IMCs joints and joints with the conventional interfacial structure was conducted.
引用
收藏
页码:6 / 19
页数:14
相关论文
共 52 条
  • [1] Effects of the intermetallic compound microstructure on the tensile behavior of Sn3.0Ag0.5Cu/Cu solder joint under various strain rates
    An, Tong
    Qin, Fei
    [J]. MICROELECTRONICS RELIABILITY, 2014, 54 (05) : 932 - 938
  • [2] Intergranular cracking simulation of the intermetallic compound layer in solder joints
    An, Tong
    Qin, Fei
    [J]. COMPUTATIONAL MATERIALS SCIENCE, 2013, 79 : 1 - 14
  • [3] Sn-Ag-Cu solders and solder joints: Alloy development, microstructure, and properties
    Anderson, IE
    Cook, BA
    Harringa, JL
    Terpstra, RL
    [J]. JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, 2002, 54 (06): : 26 - 29
  • [4] [Anonymous], 2016, THESIS
  • [5] Reliability study of 3D IC packaging based on through-silicon interposer (TSI) and silicon-less interconnection technology (SLIT) using finite element analysis
    Che, Fa Xing
    Zhang, Xiaowu
    Lin, Jong-Kai
    [J]. MICROELECTRONICS RELIABILITY, 2016, 61 : 64 - 70
  • [6] Strain- and strain-rate-dependent mechanical properties and behaviors of Cu3Sn compound using molecular dynamics simulation
    Cheng, Hsien-Chie
    Yu, Ching-Feng
    Chen, Wen-Hwa
    [J]. JOURNAL OF MATERIALS SCIENCE, 2012, 47 (07) : 3103 - 3114
  • [7] Formation of nearly void-free Cu3Sn intermetallic joints using nanotwinned Cu metallization
    Chiu, Wei-Lan
    Liu, Chien-Min
    Haung, Yi-Sa
    Chen, Chih
    [J]. APPLIED PHYSICS LETTERS, 2014, 104 (17)
  • [8] Nanoindentation measurements on Cu-Sn and Ag-Sn intermetallics formed in Pb-free solder joints
    Chromik, RR
    Vinci, RP
    Allen, SL
    Notis, MR
    [J]. JOURNAL OF MATERIALS RESEARCH, 2003, 18 (09) : 2251 - 2261
  • [9] Emerging Interconnects and Pb-free Materials for Advanced Electronic Packaging
    Cotts, Eric
    Arfaei, Babak
    [J]. JOM, 2015, 67 (10) : 2381 - 2382
  • [10] Investigating the effect of isothermal aging on the morphology and shear strength of Sn-5Sb solder reinforced with carbon nanotubes
    Dele-Afolabi, T. T.
    Hanim, M. A. Azmah
    Norkhairunnisa, M.
    Yusoff, H. M.
    Suraya, M. T.
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2015, 649 : 368 - 374