Approaching ultimate resolution for soft x-ray spectrometers

被引:4
作者
Chiuzbaian, Sorin G. [1 ]
Hague, Coryn F. [1 ]
Luening, Jan [1 ]
机构
[1] UPMC Univ Paris 06, CNRS, Lab Chim Phys Matiere & Rayonnement, UMR 7614, F-75005 Paris, France
关键词
GRAZING-INCIDENCE INSTRUMENT; EMISSION-SPECTROSCOPY; SPECTROGRAPH; RADIATION; UNDULATOR; DESIGN;
D O I
10.1364/AO.51.004684
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We explore the potential performance of soft x-ray spectrometers based on the use of varied-line-spacing spherical diffraction gratings (VLS-SG). The quantitative assessment is based on an optimization procedure to obtain both negligible optical aberrations at full illumination of the grating and a quasi linear focal curve. It involves high-order optical aberration cancellation to calculate the focal curves. We also examine the validity of small divergence closed-form formulas describing the light path function. Optimizing the optical and geometric parameters gives an ultimate resolving power, at 930 eV, of between 10 800 for a 3 m long instrument and 34 000 for an 11 m spectrometer according to the Rayleigh criterion. Typical fabrication tolerances would scale these values down by about 10%. The findings are validated by ray-tracing simulations. (C) 2012 Optical Society of America
引用
收藏
页码:4684 / 4690
页数:7
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