Perfect Broadband Terahertz Antireflection by Deep-Subwavelength, Thin, Lamellar Metallic Gratings

被引：19

作者：

Ding, Lu ^{[1
]}

Wu, Qing Yang Steve ^{[1
]}

Song, Jun Feng ^{[2
]}

Serita, Kazunori ^{[3
]}

Tonouchi, Masayoshi ^{[3
]}

Teng, Jing Hua ^{[1
]}

机构：

[1] ASTAR, Inst Mat Res & Engn, Singapore 117602, Singapore

[2] ASTAR, Inst Microelect, Singapore 117685, Singapore

[3] Osaka Univ, Inst Laser Engn, Suita, Osaka 5650871, Japan

来源：

ADVANCED OPTICAL MATERIALS | 2013年 / 1卷 / 12期

关键词：

MEAN FREE-PATH; NEGATIVE-INDEX; CONDUCTIVITY; RESISTIVITY; REFLECTION; REFRACTION; ELECTRONS; FILMS;

D O I：

10.1002/adom.201300321

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：910 / 914

页数：5

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