Improvement of Thermal Environment by Thermoelectric Coolers and Numerical Optimization of Thermal Performance

被引:15
作者
Wang, Ning [1 ]
Li, Xiao-Chun [1 ]
Mao, Jun-Fa [1 ]
机构
[1] Shanghai Jiao Tong Univ, Minist Educ Design & Electromagnet Compatibil Hig, Key Lab, Shanghai 200240, Peoples R China
基金
中国国家自然科学基金;
关键词
Controlled-collapse-chip-connection (C4); Seebeck; thermal runaway; thermal stability; thermoelectric coolers (TECs); TEMPERATURE; POWER; DEVICES; MANAGEMENT; CHIPS; MODEL;
D O I
10.1109/TED.2015.2442530
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Seeking for an available thermal runaway solution is becoming one important and challenging issue in current nanometer ICs. Thermoelectric coolers (TECs) may give a solution. In this paper, a simplified power model of circuits closely associated with temperature with and without repeaters is derived. Based on the surface temperature difference and heat-flow density, an equivalent thermal resistance model for powered TECs is proposed. According to the thermal profile model, the steady-state temperature is calculated for the same chip with two different package forms. Finally, optimizations of p-n couples are performed with the purpose of obtaining the maximum coefficient of performance (COP) and minimum TECs power. As compared with the traditional flip-flop controlled-collapse-chip-connection package, the results reveal desirable conclusions that a 15.8% decrease of the chip stability temperature with the COP optimization at I = 2.5 A and 11.4% steady-state power savings with the 13.2 W TEC power consumption are obtained in a 50-nm technology node. Analysis demonstrates that the maximum COP and minimum power consumed by TECs can be obtained at different optimum numbers of p-n couples, which is independent of electrical current across by TECs.
引用
收藏
页码:2579 / 2586
页数:8
相关论文
共 30 条
[1]   Numerical optimization of the thermoelectric cooling devices [J].
Abramzon, Boris .
JOURNAL OF ELECTRONIC PACKAGING, 2007, 129 (03) :339-347
[2]   Modeling and analysis of nonuniform substrate temperature effects on global ULSI interconnects [J].
Ajami, AH ;
Banerjee, K ;
Pedram, M .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2005, 24 (06) :849-861
[3]   Analysis of substrate thermal gradient effects on optimal buffer insertion [J].
Ajami, AH ;
Banerjee, K ;
Pedram, M .
ICCAD 2001: IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER AIDED DESIGN, DIGEST OF TECHNICAL PAPERS, 2001, :44-48
[4]   Solid-State Thermal Management for Lithium-Ion EV Batteries [J].
Alaoui, Chakib .
IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY, 2013, 62 (01) :98-107
[5]  
[Anonymous], 2012, International Technology Roadmap for Semiconductors
[6]   A three-dimensional theoretical model for predicting transient thermal behavior of thermoelectric coolers [J].
Cheng, Chin-Hsiang ;
Huang, Shu-Yu ;
Cheng, Tsung-Chieh .
INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER, 2010, 53 (9-10) :2001-2011
[7]   Sensitivity analysis and optimization of thin-film thermoelectric coolers [J].
Choday, Sri Harsha ;
Roy, Kaushik .
JOURNAL OF APPLIED PHYSICS, 2013, 113 (21)
[8]  
Chowdhury I, 2010, IPACK 2009: PROCEEDINGS OF THE ASME INTERPACK CONFERENCE 2009, VOL 2, P521
[9]  
Chowdhury I, 2009, NAT NANOTECHNOL, V4, P235, DOI [10.1038/NNANO.2008.417, 10.1038/nnano.2008.417]
[10]   Ultrathin Thermoelectric Devices for On-Chip Peltier Cooling [J].
Gupta, Man Prakash ;
Sayer, Min-Hee ;
Mukhopadhyay, Saibal ;
Kumar, Satish .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2011, 1 (09) :1395-1405