Current status of SiC power switching devices: Diodes & GTOs

被引:4
作者
Seshadri, S [1 ]
Agarwal, AK [1 ]
Hall, WB [1 ]
Mani, SS [1 ]
MacMillan, MF [1 ]
Rodrigues, R [1 ]
Hanson, T [1 ]
Khatri, S [1 ]
Sanger, PA [1 ]
机构
[1] Northrop Grumman Corp, STC, ESSS, Pittsburgh, PA 15235 USA
来源
WIDE-BANDGAP SEMICONDUCTORS FOR HIGH-POWER, HIGH-FREQUENCY AND HIGH-TEMPERATURE APPLICATIONS-1999 | 1999年 / 572卷
关键词
D O I
10.1557/PROC-572-23
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The progress that has been made in SE diodes and GTOs is reviewed. A 100 A/1000 V SiC p-i-n diode package, the highest current rating reported for any SiC device, a 69 A conduction/11 A turn-off of a SE GTO and MTO(TM), as well as the first ah-SE, 3 phase Pulse Width Modulated (PWM) inverter are reported, herein, for the first time. The inverter achieves voltage controlled turn off with a high temperature capable, hybrid SE JFET. Material and process technology issues that will need to be addressed before device commercialization can be realized are discussed.
引用
收藏
页码:23 / 32
页数:10
相关论文
共 14 条
  • [1] Temperature dependence of Fowler-Nordheim current in 6H- and 4H-SiC MOS capacitors
    Agarwal, AK
    Seshadri, S
    Rowland, LB
    [J]. IEEE ELECTRON DEVICE LETTERS, 1997, 18 (12) : 592 - 594
  • [2] COMPARISON OF 6H-SIC, 3C-SIC, AND SI FOR POWER DEVICES
    BHATNAGAR, M
    BALIGA, BJ
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (03) : 645 - 655
  • [3] Wide bandgap semiconductor power devices
    Chow, TP
    Ramungul, N
    Ghezzo, M
    [J]. POWER SEMICONDUCTOR MATERIALS AND DEVICES, 1998, 483 : 89 - 102
  • [4] Performance limiting surface defects in SiC epitaxial p-n junction diodes
    Kimoto, T
    Miyamoto, N
    Matsunami, H
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (03) : 471 - 477
  • [5] LI B, 1998, IEEE ELECT DEV LETT
  • [6] Time-dependent-dielectric-breakdown measurements of thermal oxides on N-type 6H-SiC
    Maranowski, MM
    Cooper, JA
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (03) : 520 - 524
  • [7] Switching behaviour of fast high voltage SiC pn-diodes
    Mitlehner, H
    Friedrichs, P
    Peters, D
    Schorner, R
    Weinert, U
    Weis, B
    Stephani, D
    [J]. ISPSD '98 - PROCEEDINGS OF THE 10TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS, 1998, : 127 - 130
  • [8] MOOKEN J, 1997, P 32 IEEE IND APPL S
  • [9] Study of bulk and elementary screw dislocation assisted reverse breakdown in low-voltage (<250 V) 4H-SiC p+n junction diodes -: Part I:: DC properties
    Neudeck, PG
    Huang, W
    Dudley, M
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (03) : 478 - 484
  • [10] Study of bulk and elementary screw dislocation assisted reverse breakdown in low-voltage (<250 V) 4H-SiC p+n junction diodes -: Part II:: Dynamic breakdown properties
    Neudeck, PG
    Fazi, C
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (03) : 485 - 492