Energy barriers for point-defect reactions in 3C-SiC

被引:63
作者
Zheng, Ming-Jie [1 ]
Swaminathan, Narasimhan [1 ,3 ]
Morgan, Dane [1 ,2 ]
Szlufarska, Izabela [1 ,2 ]
机构
[1] Univ Wisconsin, Dept Mat Sci & Engn, Madison, WI 53706 USA
[2] Univ Wisconsin, Mat Sci Program, Madison, WI 53706 USA
[3] Indian Inst Technol, Dept Mech Engn, Madras 600036, Tamil Nadu, India
基金
美国国家科学基金会;
关键词
INITIO MOLECULAR-DYNAMICS; TOPOLOGICAL DISORDER; AMORPHOUS TRANSITION; SILICON-CARBIDE; IRRADIATION; AMORPHIZATION; TEMPERATURE; SIMULATION; RECOVERY; SEMICONDUCTOR;
D O I
10.1103/PhysRevB.88.054105
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Energy barriers of the key annealing reactions of neutral and charged point defects in SiC are calculated with ab initio density functional theory methods. In order to effectively search for the lowest energy migration paths the preliminary path is first established based on ab initio molecular dynamics (AIMD) simulations. The energy barrier of each hop is then calculated via climbing image nudged elastic band methods for paths guided by the AIMD simulations. The final paths and barriers are determined by comparing different pathways. The annealing reactions have important implications in understanding the amorphization, recovery, and other aspects of the radiation response of SiC. The results are compared with the literature data and experimental results on SiC recovery and amorphization. We propose that the C interstitial and Si antisite annealing reaction may provide a critical barrier that governs both the recovery stage III and amorphization processes.
引用
收藏
页数:15
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