A case study of novel X-ray Optics for FEL sources

被引：6

作者：

Rehanek, J. ^{[1
]}

Schaefers, F. ^{[1
]}

Loechel, H. ^{[1
]}

Firsov, A. ^{[1
]}

Gruenert, J. ^{[2
]}

Freund, W. ^{[2
]}

Ozkan, C. ^{[2
]}

Molodtsov, S. ^{[2
]}

Erko, A. ^{[1
]}

机构：

[1] HZB BESSY II, Inst Nanometre Opt & Technol, Albert Einstein Str 15, D-12489 Berlin, Germany

[2] European XFEL GmbH, D-22761 Hamburg, Germany

来源：

11TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI 2012) | 2013年 / 425卷

关键词：

D O I：

10.1088/1742-6596/425/5/052013

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We suggest optical schemes for the European X-ray Free Electron Laser facility (XFEL.EU) in Hamburg: a single element X-ray spectrometer on the basis of a reflection zone plate (RZP) for single-shot diagnostics; and a two-element soft X-ray spectrometer on the basis of two RZPs to carry out Resonant Inelastic X-ray Scattering (RIXS) experiments. With this setup, a full map of the sample spectrum is obtainable in a single measurement. The main advantage of using zone plates is the possibility to enable dispersion and focusing in one step. Moreover, highest possible X-ray transmission is achieved by using the minimum number of optical elements. Taking into account the European XFEL beam parameters, our simulations, concerning the RIXS experiment, produced very promising results, reaching an energy resolution (E/Delta E) of up to 30,000 at photon energy of 1 keV. When applied as a single shot spectrometer the energy resolution for RZP is of the same order of magnitude.

引用

页数：4

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