Polarization and far-field diffraction patterns of total internal reflection corner cubes

被引:28
作者
Murphy, Thomas W., Jr. [1 ]
Goodrow, Scott D. [1 ]
机构
[1] Univ Calif San Diego, Ctr Astrophys & Space Sci, La Jolla, CA 92093 USA
基金
美国国家科学基金会;
关键词
COEFFICIENTS;
D O I
10.1364/AO.52.000117
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Many corner cube prisms, or retroreflectors, employ total internal reflection (TIR) via uncoated rear surfaces. The different elliptical polarization states emerging from the six unique paths through the corner cube complicate the far-field diffraction pattern by introducing various phase delays between the six paths. In this paper, we present a computational framework to evaluate polarization through TIR corner cubes for arbitrary incidence angles and input polarization states, presenting example output for key normal-incidence conditions. We also describe a method to produce far-field diffraction patterns resulting from the polarization analysis, presenting representative images-broken into orthogonal polarizations-and characterizing key cases. Laboratory confirmation is also presented for both polarization states and far-field diffraction patterns. (C) 2013 Optical Society of America
引用
收藏
页码:117 / 126
页数:10
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