Comparative certification of secondary-electron multipliers within the ultrasoft X-ray range

被引：2

作者：

Legkodymov, A. A. ^{[1
]}

Mashkovtsev, M. R. ^{[1
]}

Nikolenko, A. D. ^{[1
]}

Pindyurin, V. F. ^{[1
]}

Lyakh, V. V. ^{[1
]}

Avakyan, S. V. ^{[2
]}

Voronin, N. A. ^{[2
]}

机构：

[1] Russian Acad Sci, Budker Inst Nucl Phys, Siberian Branch, Novosibirsk 630090, Russia

[2] All Russia Res Ctr, SI Vavilov State Opt Inst, St Petersburg 199034, Russia

来源：

JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES | 2012年 / 6卷 / 03期

关键词：

RADIATION;

D O I：

10.1134/S1027451012050138

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The results of studying the band characteristics and the efficiency of recording the secondary-electron multipliers VEU-6 and VEU-GOI (manufactured by the Vavilov State Optical Institute (GOI), St. Petersburg) within the ultrasoft X-ray range are given. The measurements were carried out at the metrological station Kosmos with the use of synchrotron radiation from the storage ring VEPP-4M (Budker Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk) in monochromatic radiation at a photon energy of 268 eV. A strong irregularity in the band characteristics of both VEU-6 and VEU-GOI has been found. Their quantum efficiencies are estimated. The measurements are a continuation of the works on calibration of the equipment of the Space Solar Patrol (developed by GOI) using synchrotron radiation from the VEPP-4M storage ring (project MNTTs no. 2500).

引用

页码：404 / 407

页数：4

共 8 条

[1] Laboratory studies of apparatus for monitoring ionizing solar radiation from space [J].

Avakyan, SV ;

Andreev, EP ;

Afanas'ev, IM ;

Voronin, NA ;

Lebedinskaya, ML ;

Leonov, NB ;

Kuvaldin, EV ;

Savushkin, AV ;

Serova, AE ;

Savinov, EP .

JOURNAL OF OPTICAL TECHNOLOGY, 2001, 68 (02) :81-88

[2]

Einbund M. R., 1981, OPEN TYPE SECONDARY

[3]

Gavrilov N. G., 2000, POVERKHNOST, V1, P129

[4] Stable silicon photodiodes for absolute intensity measurements in the VUV and soft x-ray regions [J].

Gullikson, EM ;

Korde, R ;

Canfield, LR ;

Vest, RE .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1996, 80 :313-316

[5]

IRD, AMPL AXUV SER PHOT

[6]

IRD AXUV Publ, AXUV PUBL

[7]

Nikolenko A. D., 2012, POVERKHNOST IN PRESS

[8] Characterization of detectors for extreme UV radiation [J].

Scholze, F. ;

Klein, R. ;

Mueller, R. .

METROLOGIA, 2006, 43 (02) :S6-S10

← 1 →