Susceptibility Scanning as a Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems

被引：51

作者：

Muchaidze, Giorgi ^{[1
]}

Koo, Jayong ^{[2
]}

Cai, Qing ^{[2
]}

Li, Tun ^{[2
]}

Han, Lijun ^{[3
]}

Martwick, Andrew ^{[4
]}

Wang, Kai ^{[4
]}

Min, Jin ^{[1
]}

Drewniak, James L. ^{[2
]}

Pommerenke, David ^{[2
]}

机构：

[1] Amber Precis Instruments, Santa Clara, CA 95054 USA

[2] Missouri Univ Sci & Technol, Rolla, MO 65409 USA

[3] Garmin Int Inc, Olathe, KS 66062 USA

[4] Intel Corp, Hillsboro, OR 97124 USA

来源：

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 2008年 / 50卷 / 02期

关键词：

Electrostatic discharges (ESDs); immunity; scanning; susceptibility;

D O I：

10.1109/TEMC.2008.921059

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed.

引用

页码：268 / 276

页数：9

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