Alpha-particle emission probabilities of 236U obtained by alpha spectrometry

被引：11

作者：

Marouli, M. ^{[1
]}

Pomme, S. ^{[1
]}

Jobbagy, V. ^{[1
]}

Van Ammel, R. ^{[1
]}

Paepen, J. ^{[1
]}

Stroh, H. ^{[1
]}

Benedik, L. ^{[2
]}

机构：

[1] European Commiss, Joint Res Ctr, Inst Reference Mat & Measurements, B-2440 Geel, Belgium

[2] Jozef Stefan Inst, Ljubljana 39,1000, Slovenia

来源：

APPLIED RADIATION AND ISOTOPES | 2014年 / 87卷

关键词：

Alpha spectrometry; U-236; Decay data; Emission probabilities; DECAY DATA;

D O I：

10.1016/j.apradiso.2013.11.020

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

High-resolution alpha-particle spectrometry was performed with an ion-implanted silicon detector in vacuum on a homogeneously electrodeposited U-236 source. The source was measured at different solid angles subtended by the detector, varying between 0.8% and 2.4% of 4 pi sr, to assess the influence of coincidental detection of alpha-particles and conversion electrons on the measured alpha-particle emission probabilities. Additional measurements were performed using a bending magnet to eliminate conversion electrons, the results of which coincide with normal measurements extrapolated to an infinitely small solid angle. The measured alpha emission probabilities for the three main peaks - 74.20 (5)%, 25.68 (5)% and 0.123 (5)%, respectively - are consistent with literature data, but their precision has been improved by at least one order of magnitude in this work. (C) 2013 Elsevier Ltd. All rights reserved.

引用

页码：292 / 296

页数：5

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