On the origin of emission and thermal quenching of SRSO:Er3+ films grown by ECR-PECVD

被引:19
作者
Podhorodecki, Artur [1 ]
Zatryb, Grzegorz [1 ]
Golacki, Lukasz W. [1 ]
Misiewicz, Jan [1 ]
Wojcik, Jacek [2 ,3 ]
Mascher, Peter [2 ,3 ]
机构
[1] Wroclaw Univ Technol, Inst Phys, PL-50370 Wroclaw, Poland
[2] McMaster Univ, Dept Engn Phys, Hamilton, ON L8S 4L7, Canada
[3] McMaster Univ, Ctr Emerging Device Technol, Hamilton, ON L8S 4L7, Canada
来源
NANOSCALE RESEARCH LETTERS | 2013年 / 8卷
基金
加拿大自然科学与工程研究理事会;
关键词
Silicon; Nanocrystals; Erbium; Emission; Quenching; Temperature; Photoluminescence; ENERGY-TRANSFER; SI NANOCLUSTERS; ER3+ IONS; SILICON NANOCRYSTALS; EXCITATION; LUMINESCENCE; MECHANISMS; DEPENDENCE; DYNAMICS; LIFETIME;
D O I
10.1186/1556-276X-8-98
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Silicon nanocrystals embedded in a silicon-rich silicon oxide matrix doped with Er3+ ions have been fabricated by electron cyclotron resonance plasma-enhanced chemical vapor deposition. Indirect excitation of erbium photoluminescence via silicon nanocrystals has been investigated. Temperature quenching of the photoluminescence originating from the silicon nanocrystals and the erbium ions has been observed. Activation energies of the thermally activated quenching process were estimated for different excitation wavelengths. The temperature quenching mechanism of the emission is discussed. Also, the origin of visible emission and kinetic properties of Er-related emission have been discussed in details.
引用
收藏
页码:1 / 12
页数:12
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