Integrated vacuum packaging for low-cost light-weight uncooled microbolometer arrays

被引:15
|
作者
Cole, BE [1 ]
Higashi, RE [1 ]
Ridley, JA [1 ]
Wood, RA [1 ]
机构
[1] Honeywell Labs, Plymouth, MN 55441 USA
关键词
D O I
10.1117/12.445291
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Uncooled thermal infrared sensors (1) require to be operated in an ambient gas pressure of about 50mTorr or less to avoid sensitivity being reduced by thermal conduction through the gas. Although sealed packages have been developed which can retain a sufficiently low internal pressure for many years, the packaging process (cleaning, assembly, pumping, baking, getter firing, sealing) and materials add significant cost and weight. Lower cost is the major reason for the development of uncooled arrays, and low weight is essential for many applications (eg unmanned aerial vehicles, helmet mounted applications). In response to these needs, Honeywell has developed a silicon "Integrated Vacuum Package" (IVP) process which produces a low-cost lightweight (0.2 gram) compact vacuum package by a wafer-scale process (2). The IVP process basically consists of bonding a silicon "topeap" wafer to the array wafer, to produce a bonded double-wafer with multiple arrays protected in individual vacuum packages. The double-wafer may be easily handled without damage to the protected arrays, and diced into individual dies using normal silicon dicing techniques. It has been found helpful to use an etched evacuation via, which allows wafer bonding, pumping, baking and sealing to be performed in separate stages, at their, different optimum times and temperatures. The IVP process will be described, and packages suitable for linear and two-dimensional uncooled arrays will be reported, with performance and lifetime measurements.
引用
收藏
页码:235 / 239
页数:5
相关论文
共 50 条
  • [1] An Uncooled Infrared Microbolometer Array for Low-Cost Applications
    Shen, Ning
    Yu, Jun
    Tang, Zhenan
    IEEE PHOTONICS TECHNOLOGY LETTERS, 2015, 27 (12) : 1247 - 1249
  • [2] A Low-Cost Uncooled Infrared Microbolometer by CMOS Process
    Shen, Ning
    Huang, Zhengxing
    Tang, ZhenAn
    ECS SOLID STATE LETTERS, 2015, 4 (07) : Q29 - Q31
  • [3] Light-weight, low-cost PUR targets automotive
    Graff, G
    MODERN PLASTICS, 1998, 75 (08): : 62 - +
  • [4] Low-cost, light-weight Mars landing system
    Warwick, RW
    2003 IEEE AEROSPACE CONFERENCE PROCEEDINGS, VOLS 1-8, 2003, : 3553 - 3564
  • [5] Performance analysis of low-cost uncooled microbolometer infrared detectors
    Zhang Junju
    Sun Lianjun
    Wang Shiyun
    Chang Benkang
    Qian Yunsheng
    Yu Chunyu
    OPTOELETRONIC MATERIALS AND DEVICES, PTS 1 AND 2, 2006, 6352
  • [6] A Low-cost and Light-weight Motion Tracking Suit
    Salehi, Sarvenaz
    Bleser, Gabriele
    Schmitz, Norbert
    Stricker, Didier
    2013 IEEE 10TH INTERNATIONAL CONFERENCE ON AND 10TH INTERNATIONAL CONFERENCE ON AUTONOMIC AND TRUSTED COMPUTING (UIC/ATC) UBIQUITOUS INTELLIGENCE AND COMPUTING, 2013, : 474 - 479
  • [7] A low-cost uncooled infrared aluminum microbolometer in a standard CMOS technology
    Shen, Ning
    Tang, Zhen'an
    Feng, Chong
    PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART N-JOURNAL OF NANOMATERIALS NANOENGINEERING AND NANOSYSTEMS, 2014, 228 (03) : 114 - 118
  • [8] A low-cost uncooled infrared microbolometer detector in standard CMOS technology
    Tezcan, DS
    Eminoglu, S
    Akin, T
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2003, 50 (02) : 494 - 502
  • [9] Radiometric packaging of uncooled microbolometer FPA arrays for space applications
    Garcia-Blanco, S.
    Cote, P.
    Leclerc, M.
    Blanchard, N.
    Desroches, Y.
    Caron, J-S.
    Phong, L. Ngo
    Chateauneuf, F.
    Pope, T.
    RELIABILITY, PACKAGING, TESTING, AND CHARACTERIZATION OF MEMS/MOEMS AND NANODEVICES VIII, 2009, 7206
  • [10] Amorphous silicon-based uncooled microbolometer technology for low-cost IRFPA
    Bain, A
    Martin, JL
    Mottin, E
    Buffet, JLO
    Tissot, JL
    Tronel, R
    Vilain, M
    Yon, JJ
    SENSORS AND MATERIALS, 2000, 12 (06) : 365 - 373