Structural analysis of oxide ion conductor, Ba2-xSrxIn2O5 and Ba2In2-xGaxO5 - Significance of synchrotron X-ray diffraction at high temperatures

被引:1
作者
Hashimoto, Takuya [1 ]
Yoshinaga, Masashi [1 ]
Nakano, Koutatsu [1 ]
Omoto, Kazuki [1 ]
Sugimoto, Takayuki [1 ]
Tanaka, Masahiko [2 ]
Yashima, Masatomo [3 ]
机构
[1] Nihon Univ, Coll Humanities & Sci, Dept Integrated Sci Phys & Biol, Setagaya Ku, Tokyo 1568550, Japan
[2] Natl Inst Mat Sci, NIMS Beamline Stn Spring 8, Sayo, Hyogo 6795198, Japan
[3] Tokyo Inst Technol, Interdisciplinary Grad Sch Sci & Engn, Yokohama, Kanagawa 2268502, Japan
关键词
Synchrotron X-ray diffraction; Ba2In2-xGaxO5; Ba2-xSrxIn2O5; Oxide ion conductor; Structural phase transition; Crystal structure; PHASE-TRANSITIONS; BA2IN2O5; SYSTEM; RADIATION;
D O I
10.2109/jcersj2.117.56
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
High temperature synchrotron X-ray diffraction measurements have been performed on Ba2-xSrxIn2O5 and Ba2In2-xGaxO5, which exhibits two kinds of structural phase transition and high oxide ion conductivity at the high temperature phase. It has been revealed that the synchrotron X-ray diffraction with high sensitivity and resolution is necessary to detect any slight distortion from ideal cubic perovskite in cation substituted Ba2In2O5 system. By using synchrotron X-ray diffraction, the slight distortion from ideal cubic perovskite in Ba2In2-xGaxO5, which could not be observed by using Cu K alpha X-ray diffraction, has been clarified. The larger and smaller distortions have been observed with an increase of Sr and Ga content, respectively, which can be explained from the viewpoint of variation of the tolerance factor. (C)2009 The Ceramic Society of Japan All rights reserved.
引用
收藏
页码:56 / 59
页数:4
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