Mapping error of simplified dynamic models in electrical metrology

被引:0
作者
Layer, E [1 ]
机构
[1] Cracow Univ Technol, Fac Elect & Comp Engn, PL-31155 Krakow, Poland
来源
IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3 | 1999年
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The paper presents a theory and ifs practical application ill the process of the determination? of the mapping error of simplified dynamic models. This mapping is expressed by means of the integral-square-error criterion. A special calculation algorithm shelving how to compute the maximum value of this criterion is discussed and presented in detail. The paper shows also the method of a synthesis of a special class of simplified models which, in the initial time interval, map the models of the higher order with a very snail error. The particular transformations, presented in the matrix notation, are defined in this paper for this method The theory presented in the paper is illustrated with a numerical example.
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页码:1704 / 1709
页数:6
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