The influence of in-plane 0-45° grain boundary on microwave surface resistance of c-axis YBa2Cu3Oy films on MgO substrate

被引：21

作者：

Kusunoki, M ^{[1
]}

Takano, Y ^{[1
]}

Mukaida, M ^{[1
]}

Ohshima, S ^{[1
]}

机构：

[1] Yamagata Univ, Dept Elect & Informat Engn, Yonezawa, Yamagata 9928510, Japan

来源：

PHYSICA C | 1999年 / 321卷 / 1-2期

关键词：

0-45 degrees grain boundary; surface resistance; c-axis YBa2Cu3Oy; self-template; dielectric resonator; cryocooler;

D O I：

10.1016/S0921-4534(99)00361-5

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The effect of in-plane 0-45 degrees grain boundaries on surface resistance (R-s) of c-axis YBa2Cu3Oy (YBCO) films on MgO substrates is discussed. Samples that have various densities of 45 degrees rotated grains were prepared using a self-template technique. The R-s values at 22 GHz were measured by the dielectric resonator method using a cryocooler. The R-s systematically changed corresponding to the amount of 0-45 degrees grain boundaries. Conspicuous feature of the films including 0-45 degrees grain boundaries is a large residual surface resistance. The R-s of almost perfectly in-plane aligned YBCO film scaled to 10 GHz were 0.12 m Omega at 20 K and 0.67 m Omega at 77 K on the assumption of tan delta = 0, respectively. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：81 / 85

页数：5

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