The atomic hydrogen flux to silicon growth flux ratio during microcrystalline silicon solar cell deposition

被引:37
作者
Dingemans, G. [1 ,2 ]
van den Donker, M. N. [1 ,2 ]
Hrunski, D. [2 ]
Gordijn, A. [2 ]
Kessels, W. M. M. [1 ]
van de Sanden, M. C. M. [1 ]
机构
[1] Eindhoven Univ Technol, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands
[2] Forschungszentrum Julich, IEF5 Photovoltaik, D-52425 Julich, Germany
关键词
D O I
10.1063/1.2987519
中图分类号
O59 [应用物理学];
学科分类号
摘要
The H flux to Si growth flux ratio is experimentally determined under state-of-the-art silicon thin-film deposition conditions by employing the recently introduced etch product detection technique. Under the technologically relevant high-pressure depletion conditions and for different process parameter settings such as pressure, SiH4 concentration, rf power, and excitation frequency, it was demonstrated that the microcrystalline to amorphous silicon phase transition is uniquely and reactor independently determined by the flux ratio of H and Si growth species. (C) 2008 American Institute of Physics.
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页数:3
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