Epoxy infiltration into nanoporous aluminum oxide

被引:2
作者
Arayasantiparb, D
McKnight, S
Libera, M
机构
[1] Stevens Inst Technol, Dept Chem Biochem & Mat Engn, Hoboken, NJ 07030 USA
[2] USA, Res Lab, Aberdeen Proving Ground, MD USA
关键词
electron energy-loss spectroscopy; nanoporous aluminum oxide; DGEBA; PACM20; interphase; electron microscopy;
D O I
10.1080/00218460108030726
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
This research uses spatially-resolved electron energy-loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM) to study epoxy infiltration into a nanoporous aluminum surface oxide. Imaging by scanning electron microscopy (SEM) shows that the oxide surface of an as-anodized aluminum wire consists of columnar nanopores with diameters ranging from approximately 5 - 150 nm. Anodized wires were embedded in a 100 g: 28 g mixture of DGEBA (diglycidyl ether of bisphenol-A) resin and PACM20 (bis(p-aminocyclohexyl)methane) curing agent followed by a two-step cure. Electron-transparent sections were cut by ultramicrotomy. Spatially-resolved carbon and oxygen EELS profiles from the oxide are anti-correlated indicating that oxide pore walls are separated by pore interiors containing epoxy. Spatially-resolved low-loss spectral data are transformed into a measure of apparent specimen thickness. Comparisons of such data with simulations based on experimentally derived oxide topologies indicate that the pores are fully filled.
引用
收藏
页码:353 / 370
页数:18
相关论文
共 45 条
[21]  
HERCULES DM, 1977, CHARACTERIZATION MET, P399
[22]   THE SCIENCE OF ADHESION .1. SURFACE AND INTERFACIAL ASPECTS [J].
KINLOCH, AJ .
JOURNAL OF MATERIALS SCIENCE, 1980, 15 (09) :2141-2166
[23]  
KINLOCH AJ, 1986, MAT AEROSPACE, P279
[24]   Hexagonal pore arrays with a 50-420 nm interpore distance formed by self-organization in anodic alumina [J].
Li, AP ;
Muller, F ;
Birner, A ;
Nielsch, K ;
Gosele, U .
JOURNAL OF APPLIED PHYSICS, 1998, 84 (11) :6023-6026
[25]   HIGH-SPATIAL-RESOLUTION ANALYSIS OF GE LAYERS IN SI [J].
LIBERA, M ;
SMITH, DA ;
TSUNG, L ;
EAGLESHAM, D .
ULTRAMICROSCOPY, 1993, 52 (3-4) :564-569
[26]   EELS LOG-RATIO TECHNIQUE FOR SPECIMEN-THICKNESS MEASUREMENT IN THE TEM [J].
MALIS, T ;
CHENG, SC ;
EGERTON, RF .
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1988, 8 (02) :193-200
[27]  
MATIENZO LJ, 1983, 15 NAT SAMPE TECHN C, P604
[28]  
MCNAMARA DK, 1979, 11 SAMPE TECH C NOV, P740
[29]  
NITSCHKE F, 1991, J ADHES SCI TECHNOL, V5, P697
[30]  
PACKHAM DE, 1986, 23 ANN C ADH ADH BAR, P81