Physical demonstration of polymorphic self-checking circuits

被引：40

作者：

Ruzicka, Richard ^{[1
]}

Sekanina, Lukas ^{[1
]}

Prokop, Roman

机构：

[1] Brno Univ Technol, Fac Informat Technol, Brno 61266, Czech Republic

来源：

14TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS | 2008年

关键词：

D O I：

10.1109/IOLTS.2008.23

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Polymorphic gates can be considered as a new reconfigurable technology capable of integrating logic functions with sensing in a single compact structure. Polymorphic gates whose logic function can be controlled by the level of the power supply voltage (Vdd) represent a special class of polymorphic gates. A new polymorphic NANDINOR gate controlled by Vdd is presented. This gate was fabricated and utilized in a self-checking polymorphic adder. This paper presents an experimental evaluation of this novel implementation.

引用

页码：31 / 36

页数：6

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