Spectroscopic defect imaging in magnetic nanostructure arrays

被引：12
作者：
Chia, Han-Jong [1 ,2 ]
Guo, Feng [1 ,2 ]
Belova, L. M. [3 ]
McMichael, R. D. [4 ]
机构：
[1] NIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA
[2] Univ Maryland, Maryland Nanoctr, College Pk, MD 20742 USA
[3] Royal Inst Technol, Dept Mat Sci & Engn, S-10044 Stockholm, Sweden
[4] NIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA
来源：
APPLIED PHYSICS LETTERS | 2012年 / 101卷 / 04期
关键词：
SPIN-TRANSFER-TORQUE; FERROMAGNETIC-RESONANCE;
D O I：
10.1063/1.4738789
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We introduce a method for imaging defective structures in an array of magnetic nanodevices using ferromagnetic resonance force microscopy with contrast between normal and defective devices provided through differences in resonance condition. In a demonstration of this technique, two dimensional scans of an array resolve not only intentional differences in resonant field between 200 nm circular dots and an intentional oval "defect," but also smaller differences between the nominally identical circular dots in the array. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4738789]
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页数：4
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