Two-dimensional measurement of birefringence dispersion using spectroscopic polarized light

被引：3

作者：

Wakayama, Toshitaka ^{[1
]}

Kowa, Hiroyuki

Otani, Yukitoshi

机构：

[1] Tokyo Univ Agr & Technol, Koganei, Tokyo 1848588, Japan

[2] Uniopt Co Ltd, Shizuoka 4211031, Japan

来源：

OPTICAL ENGINEERING | 2006年 / 45卷 / 03期

基金：

日本学术振兴会;

关键词：

birefringence; ellipsometry; polarimetry; polarization;

D O I：

10.1117/1.2179787

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

This paper describes a method and system for the measuring the two-dimensional distribution of birefringence dispersion. An optical arrangement consists of a white light source, parallel polarizers, a CCD camera, and an acousto-optic tunable filter for selecting wavelength of the incident light. The intensity of spectroscopic polarized light changes sinusoidally as a function of wave number, and its period changes slightly because of birefringence dispersion. The fast Fourier transform method is used to analyze the birefringence dispersion from the spectroscopic polarized light. One hundred twenty-eight captured images are used for the analysis. Some experimental results on 2-D birefringence dispersion distributions are shown for the demonstration of this method. (c) 2006 Society of Photo-Optical Instrumentation Engineers.

引用

页数：6

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