Experimental station for multiscale surface structural analyses of soft-material films at SPring-8 via a GISWAX/GIXD/XR-integrated system

被引：51

作者：

Ogawa, Hiroki ^{[1
]}

Masunaga, Hiroyasu

Sasaki, Sono

Goto, Shunji

Tanaka, Takashi ^{[2
]}

Seike, Takamitsu

Takahashi, Sunao

Takeshita, Kunikazu

Nariyama, Nobuteru

Ohashi, Haruhiko

Ohata, Toru

Furukawa, Yukito

Matsushita, Tomohiro

Ishizawa, Yasuhide

Yagi, Naoto

Takata, Masaki ^{[2
,3
]}

Kitamura, Hideo ^{[2
]}

Takahara, Atsushi ^{[4
]}

Sakurai, Kazuo ^{[4
]}

Tashiro, Kohji ^{[4
]}

Kanaya, Toshiji ^{[4
]}

Amemiya, Yoshiyuki ^{[4
]}

Horie, Kazuyuki ^{[4
]}

Takenaka, Mikihito ^{[4
]}

Jinnai, Hiroshi ^{[4
]}

Okuda, Hiroshi ^{[4
]}

Akiba, Isamu ^{[4
]}

Takahashi, Isao ^{[4
]}

Yamamoto, Katsuhiro ^{[4
]}

Hikosaka, Masamichi ^{[4
]}

Sakurai, Shinichi ^{[4
]}

Shinohara, Yuya ^{[4
]}

Sugihara, Yasunori ^{[4
]}

Okada, Akihiko ^{[4
]}

机构：

[1] Japan Synchrotron Radiat Res Inst JASRI SPring 8, Res & Utilizat Div, Sayo, Hyogo 6795198, Japan

[2] RIKEN SPring 8 Ctr, Sayo, Hyogo, Japan

[3] Univ Tokyo, Tokyo, Japan

[4] FSBL, Sayo, Hyogo, Japan

来源：

POLYMER JOURNAL | 2013年 / 45卷 / 01期

关键词：

FSBL; grazing incidence small/wide-angle X-ray scattering; grazing incidence X-ray diffraction; polymer thin films; SPring-8; X-ray reflectivity; PHASE-SEPARATION; THIN-FILMS; REFLECTION;

D O I：

10.1038/pj.2012.194

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

To gain a better understanding of the function of soft-material thin films, one should investigate the multiscale structural information from the surface roughness down to the atomically truncated structures at microarea. To achieve such an integrated investigation, a new experimental system has been launched by coupling with the measurement techniques, which include grazing incidence small/wide-angle X-ray scattering (GISWAXS) and grazing incidence X-ray diffraction (GIXD), as well as X-ray reflectivity (XR), at the BL03XU beamline of SPring-8. The high brilliance and low divergence beam allows the surface and interface structure measurements from the angstrom to the micrometer scale using a soller-slit system for proper optimization of measurement precision. A typical structural analysis of the soft-material film was performed to evaluate the practical performance and specifications of the experimental system. Polymer Journal (2013) 45, 109-116; doi: 10.1038/pj.2012.194; published online 14 November 2012

引用

页码：109 / 116

页数：8

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