Ballistic InAs Nanowire Transistors

被引:113
作者
Chuang, Steven [1 ,4 ]
Gao, Qun [2 ]
Kapadia, Rehan [1 ,4 ]
Ford, Alexandra C. [1 ,3 ,4 ]
Guo, Jing [2 ]
Javey, Ali [1 ,3 ,4 ]
机构
[1] Univ Calif Berkeley, Berkeley, CA 94720 USA
[2] Univ Florida, Gainesville, FL 32611 USA
[3] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA
[4] Univ Calif Berkeley, Berkeley Sensor & Actuator Ctr, Berkeley, CA 94720 USA
关键词
Ballistic transport; scattering; surface roughness; mean free path; quantization; subbands; ELECTRON-MOBILITY;
D O I
10.1021/nl3040674
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Ballistic transport of electrons at room temperature in top-gated InAs nanowire (NW) transistors is experimentally observed and theoretically examined. From length dependent studies, the low-field mean free path is directly extracted as similar to 150 nm. The mean free path is found to be independent of temperature due to the dominant role of surface roughness scattering. The mean free path was also theoretically assessed by a method that combines Fermi's golden rule and a numerical Schrodinger-Poisson simulation to determine the surface scattering potential with the theoretical calculations being consistent with experiments. Near ballistic transport (similar to 80% of the ballistic limit) is demonstrated experimentally for transistors with a channel length of similar to 60 nm, owing to the long mean free path of electrons in InAs NWs.
引用
收藏
页码:555 / 558
页数:4
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