Improvement of a dynamic scanning force microscope for highest resolution imaging in ultrahigh vacuum

被引：23
作者：
Torbruegge, S. [1 ]
Luebbe, J. [1 ]
Troeger, L. [1 ]
Cranney, M. [1 ]
Eguchi, T. [2 ]
Hasegawa, Y. [2 ,3 ]
Reichling, M. [1 ]
机构：
[1] Univ Osnabruck, Fachbereich Phys, D-49076 Osnabruck, Germany
[2] Univ Tokyo, Inst Solid State Phys, Kashiwa, Chiba 2778581, Japan
[3] Japan Sci & Technol Agcy, PRESTO, Chiyoda Ku, Tokyo 1020075, Japan
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2008年 / 79卷 / 08期
关键词：
D O I：
10.1063/1.2964119
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We report on a modification of a commercial scanning force microscope (Omicron UHV AFM/STM) operated in noncontact mode (NC-AFM) at room temperature in ultrahigh vacuum yielding a decrease in the spectral noise density from 2757 to 272 fm/root Hz. The major part of the noise reduction is achieved by an exchange of the originally installed light emitting diode by a laser diode placed outside the vacuum, where the light is coupled into the ultrahigh vacuum chamber via an optical fiber. The setup is further improved by the use of preamplifiers having a bandpass characteristics tailored to the cantilever resonance frequency. The enhanced signal to noise ratio is demonstrated by a comparison of atomic resolution images on CeO(2)(111) obtained before and after the modification. (C) 2008 American Institute of Physics.
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页数：7
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共 26 条
  • [1] Room-temperature reproducible spatial force spectroscopy using atom-tracking technique
    Abe, M
    Sugimoto, Y
    Custance, O
    Morita, S
    [J]. APPLIED PHYSICS LETTERS, 2005, 87 (17) : 1 - 3
  • [2] Teflon feedthrough for coupling optical fibers into ultrahigh vacuum systems
    Abraham, ERI
    Cornell, EA
    [J]. APPLIED OPTICS, 1998, 37 (10): : 1762 - 1763
  • [3] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY
    ALBRECHT, TR
    GRUTTER, P
    HORNE, D
    RUGAR, D
    [J]. JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) : 668 - 673
  • [4] Imaging the atomic arrangements on the high-temperature reconstructed α-Al2O3(0001) surface
    Barth, C
    Reichling, M
    [J]. NATURE, 2001, 414 (6859) : 54 - 57
  • [5] Step-induced tip polarity reversal investigated by dynamic force microscopy on KBr(001)
    de la Cerda, M. A. Venegas
    Abad, J.
    Madgavkar, A.
    Martrou, D.
    Gauthier, S.
    [J]. NANOTECHNOLOGY, 2008, 19 (04)
  • [6] Imaging of all dangling bonds and their potential on the Ge/Si(105) surface by noncontact atomic force microscopy
    Eguchi, T
    Fujikawa, Y
    Akiyama, K
    An, T
    Ono, M
    Hashimoto, T
    Morikawa, Y
    Terakura, K
    Sakurai, T
    Lagally, MG
    Hasegawa, Y
    [J]. PHYSICAL REVIEW LETTERS, 2004, 93 (26)
  • [7] High resolution atomic force microscopic imaging of the Si(111)-(7x7) surface: Contribution of short-range force to the images - art. no. 256105
    Eguchi, T
    Hasegawa, Y
    [J]. PHYSICAL REVIEW LETTERS, 2002, 89 (26)
  • [8] Molecular resolution in dynamic force microscopy:: topography and dissipation for weakly interacting systems
    Fendrich, M.
    Kunstmann, T.
    Paulkowski, D.
    Moeller, R.
    [J]. NANOTECHNOLOGY, 2007, 18 (08)
  • [9] Development of liquid-environment frequency modulation atomic force microscope with low noise deflection sensor for cantilevers of various dimensions
    Fukuma, T
    Jarvis, SP
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (04)
  • [10] Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy
    Fukuma, T
    Kimura, M
    Kobayashi, K
    Matsushige, K
    Yamada, H
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (05)
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