共 9 条
- [2] Da Y, 2010, MICROELECTRON RELIAB, V10, P1
- [3] Department of Defense, 2008, MILSTD810G DEP DEF
- [4] Grieu M., 2008, P EUROSIME 2008 INT, P1, DOI [10.1109/ESIME.2008.4525047, DOI 10.1109/ESIME.2008.4525047]
- [5] JEDEC, 2003, Report No. JESD22-B111
- [6] PERKINS S, 2004, P EL COMP TECHN C JU
- [7] Wong SF, 2007, ELEC COMP C, P373
- [8] Test and reliability analysis of PBGA assemblies under random vibration [J]. MICROELECTRONIC YIELD, RELIABILITY, AND ADVANCED PACKAGING, 2000, 4229 : 116 - 122
- [9] Vibration Durability Modeling and Dynamic Response Analysis of PBGA Mixed Solder Joints [J]. 2010 11TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP), 2010, : 616 - 619