Quantitative Imaging of Tg in Block Copolymers by Low-Angle Annular Dark-Field Scanning Transmission Electron Microscopy

被引：8

作者：

Aso, Ryotaro ^{[1
]}

Kurata, Hiroki ^{[1
]}

Namikoshi, Takeshi ^{[2
]}

Hashimoto, Tamotsu ^{[3
]}

Kuo, Shiao-Wei ^{[4
]}

Chang, Feng-Chih ^{[4
]}

Hasegawa, Hirokazu ^{[5
]}

Tsujimoto, Masahiko ^{[6
]}

Takano, Mikio ^{[6
]}

Isoda, Seiji ^{[6
]}

机构：

[1] Kyoto Univ, Inst Chem Res, Uji, Kyoto 6110011, Japan

[2] Kitami Inst Technol, Kitami, Hokkaido 0908507, Japan

[3] Univ Fukui, Grad Sch Engn, Fukui 9108507, Japan

[4] Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan

[5] Kyoto Univ, Grad Sch Engn, Res Adm Ctr, Kyoto 6158245, Japan

[6] Kyoto Univ, Inst Integrated Cell Mat Sci, Kyoto 6068501, Japan

来源：

MACROMOLECULES | 2013年 / 46卷 / 21期

关键词：

GLASS-TRANSITION TEMPERATURE; LIVING CATIONIC-POLYMERIZATION; STEM TOMOGRAPHY; TEM; PERFORMANCE; POLYMERS;

D O I：

10.1021/ma4014934

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

It is often difficult to observe nanoscale structures of polymeric materials using conventional transmission electron microscopy (TEM) because of their weak scattering contrast. To produce quantitative image contrast without any staining, low-angle annular dark-field scanning transmission electron microscopy (LAADF-STEM) was studied for its applicability for observing fine structures in block copolymers. The LAADF-STEM images displayed microphase-separated morphologies of block copolymers with high S/N contrast depending on the intrinsic density difference because of nonstaining. We found that the temperature dependence of the image contrast showed a kink around the glass-transition of the constituent phase, from which one can estimate glass transition temperatures and thermal expansion coefficients at nanoscale. This indicates that the LAADF-STEM imaging is an effective tool to quantitatively image nanoscale phases of polymers.

引用

页码：8589 / 8595

页数：7

共 36 条

[11] TEM and STEM Tomography for Thick Polymer Sample [J].