Rietveld refinement and X-ray powder diffraction data of GdAlSi

被引：0
|
作者：
He, W [1 ]
Zhang, JL [1 ]
Zeng, LM [1 ]
机构：
[1] Guangxi Univ, Inst Mat Sci, Nanning 530004, Peoples R China
来源：
JOURNAL OF RARE EARTHS | 2005年 / 23卷
关键词：
GdAlSi; X-ray powder diffraction data; crystal structure;
D O I：
暂无
中图分类号：
O69 [应用化学];
学科分类号：
081704 ;
摘要：
The X-ray powder diffraction data of the compound GdAlSi was studied by means of X-ray diffraction technique and refined by Rietveld method. The compound GdAlSi has tetragonal alpha-ThSi2-type structure, space group I4(1)/amd (No. 141), Z = 4, the lattice parameters a = 0.41234 (1) nm, c = 1.44202(1) nm. The Smith and Snyder figure of merit([5]) F-N is F-30 = 252.1(36). The R-factors of Rietveld refinement are R-p = 0.098 and R-wp = 0.128. The X-ray powder diffraction data are given. The field dependence of the magnetization measured at room temperature and the temperature variation of the inverse magnetic susceptibility of the compound GdAlSi were also presented.
引用
收藏
页码：332 / 335
页数：4
相关论文
共 50 条
  • [1] Rietveld Refinement and X-ray Powder Diffraction Data of GdAlSi
    何维
    张吉亮
    曾令民
    Journal of Rare Earths, 2005, (S1) : 332 - 335
  • [2] The structure of CeAlO3 by Rietveld refinement of X-ray powder diffraction data
    Fu, WT
    IJdo, DJW
    JOURNAL OF SOLID STATE CHEMISTRY, 2004, 177 (09) : 2973 - 2976
  • [3] X-ray powder diffraction data and Rietveld refinement of CrFe3NiSn5
    Huang, JR
    Zeng, LM
    Sun, ZH
    POWDER DIFFRACTION, 2004, 19 (04) : 372 - 374
  • [4] Rietveld refinement of the BaTiO3 from X-ray powder diffraction
    Sun Feng
    Yin Yansheng
    MULTI-FUNCTIONAL MATERIALS AND STRUCTURES II, PTS 1 AND 2, 2009, 79-82 : 593 - 596
  • [5] Reliability of the structural data for calcite and dolomite extracted from X-ray powder diffraction by Rietveld refinement
    Liu, Shanke
    Li, He
    Liu, Jianming
    PERIODICO DI MINERALOGIA, 2014, 83 (01): : 121 - 140
  • [6] Rietveld Structure Refinement of the Stibnite Crystals from Herja (Romania) using X-ray Powder Diffraction Data
    Branoiu, Gheorghe
    Mihai, Sonia
    Cursaru, Diana
    REVISTA DE CHIMIE, 2015, 66 (06): : 825 - 828
  • [7] Parametric Rietveld Refinement Applied to In-Situ Monitoring of X-Ray Powder Diffraction Data of Plaster Hydration
    Cordon, Heloisa Cristina Fernandes
    Ferreira, Fabio Furlan
    MATERIALS RESEARCH-IBERO-AMERICAN JOURNAL OF MATERIALS, 2019, 22
  • [8] THE RIETVELD STRUCTURE REFINEMENT OF THE EPIDOTE CRYSTALS FROM BUCEGI CONGLOMERATES (ROMANIA) USING X-RAY POWDER DIFFRACTION DATA
    Ciocirdel, Mihai
    Branoiu, Gheorghe Adrian
    GEOCONFERENCE ON SCIENCE AND TECHNOLOGIES IN GEOLOGY, EXPLORATION AND MINING, SGEM 2013, VOL I, 2013, : 209 - 216
  • [9] Rietveld Structure Refinement of the Stilbite Crystals from Deccan Traps (India) Using X-ray Powder Diffraction Data
    Branoiu, Gheorghe
    Ramadan, Ibrahim
    REVISTA DE CHIMIE, 2019, 70 (07): : 2379 - 2384
  • [10] THE CRYSTAL AND MOLECULAR-STRUCTURE OF TRIBENZYLSILANOL BY RIETVELD REFINEMENT OF POWDER X-RAY-DIFFRACTION DATA
    LIGHTFOOT, P
    GLIDEWELL, C
    BRUCE, PG
    JOURNAL OF ORGANOMETALLIC CHEMISTRY, 1994, 466 (1-2) : 51 - 54
12345