Pass fail limits - The key to effective diagnostic tests

被引：0
|
作者：
Dill, H
机构：
来源：
RESEARCH PERSPECTIVES AND CASE STUDIES IN SYSTEM TEST AND DIAGNOSIS | 1998年
关键词：
SPICE; fault simulation; diagnostics; diagnostic inferencing; testing; pass fail limits; fault detection; fault isolation; test program sets;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This chapter addresses the role of Pass/Fail limits in the detection and isolation of faults in electronic circuits. Emphasis is placed on the use of Pass/Fail limits to discriminate among suspected failures in a known faulty circuit and improving test outcome confidence. Analog circuit simulations serve to illustrate failed circuit behavior characteristics and the effect of assigning multiple Pass/Fail limits to a single test setup for improved diagnostic resolution.
引用
收藏
页码：17 / 28
页数：12
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