Nondestructive evaluation of surface defects by the use of photothermal electrochemical imaging

被引：1

作者：

Hoshimiya, T ^{[1
]}

Ishikawa, K ^{[1
]}

机构：

[1] Tohoku Gakuin Univ, Tagajyo 9858537, Japan

来源：

OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN'99) | 1999年 / 3740卷

关键词：

photothermal; electrochemical; microscopy; NDE; imaging; surface defect;

D O I：

10.1117/12.347837

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new photothermal detection scheme based on a current-change in photothermally-enhanced electrochemical reaction is proposed and demonstrated. Nondetrucstive imaging of surface defects fabricated on a metal plate, immersed in an electrolyte, has been performed with a focused laser beam and detection apparatus of photoacoustic microscope(PAM). An imaging under the environment of electrolyte based on the principle of the detection was carried out with two- and tree terminal configurations, these results were compared with that obtained with a conventional photoacoustic (PA) imaging.

引用

页码：362 / 365

页数：4