Global modeling of carrier-field dynamics in semiconductors using EMC-FDTD

被引:22
作者
Willis, K. J. [1 ]
Ayubi-Moak, J. S. [2 ]
Hagness, S. C. [1 ]
Knezevic, I. [1 ]
机构
[1] Univ Wisconsin, Dept Elect & Comp Engn, Madison, WI 53706 USA
[2] Univ Glasgow, Dept Elect & Elect Engn, Glasgow G12 8LT, Lanark, Scotland
关键词
Global modeling; THz conductivity; Microwave devices; EMC-FDTD; Monte Carlo simulation; TIME-DOMAIN SPECTROSCOPY; PROPAGATION TFSF BOUNDARY; PERFECTLY MATCHED LAYER; HIGHLY DOPED SILICON; CHARGE-TRANSPORT; ELECTRONIC-PROPERTIES; MAXWELLS EQUATIONS; IMPACT IONIZATION; PLANAR INTERFACES; BAND-STRUCTURE;
D O I
10.1007/s10825-009-0280-4
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The interactions between carriers and fields in semiconductors at low frequencies (<100 GHz) can be adequately described by numerical solution of the Boltzmann transport equation coupled with Poisson's equation. As the frequency approaches the THz regime, the quasi-static approximation fails and full-wave dynamics must be considered. Here, we review recent advances in global modeling techniques-numerical techniques that couple carrier dynamics with full wave dynamics. We focus on the coupling between the stochastic ensemble Monte Carlo (EMC) simulation of carrier transport and the finite-difference time-domain (FDTD) solution to Maxwell's curl equations. We discuss the stability and accuracy requirements for different types of high-frequency excitation (wave illumination vs. ac bias), and present simulation results for the THz-regime conductivity of doped bulk silicon, ultrafast carrier dynamics and radiation patterns in GaAs filaments, and the ac response of GaAs MESFETs.
引用
收藏
页码:153 / 171
页数:19
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