Enhancement of graphene visibility on transparent substrates by refractive index optimization

被引:10
|
作者
Goncalves, Hugo [1 ]
Alves, Lus [1 ]
Moura, Cacilda [1 ]
Belsley, Michael [1 ]
Stauber, Tobias [2 ]
Schellenberg, Peter [1 ]
机构
[1] Univ Minho, Dept Phys, P-4710057 Braga, Portugal
[2] Univ Autonoma Madrid, Dept Condensed Matter Phys, E-28049 Madrid, Spain
来源
OPTICS EXPRESS | 2013年 / 21卷 / 10期
关键词
RAMAN-SPECTROSCOPY; PROSPECTS; SHEETS; LAYERS;
D O I
10.1364/OE.21.012934
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Optical reflection microscopy is one of the main imaging tools to visualize graphene microstructures. Here is reported a novel method that employs refractive index optimization in an optical reflection microscope, which greatly improves the visibility of graphene flakes. To this end, an immersion liquid with a refractive index that is close to that of the glass support is used in-between the microscope lens and the support improving the contrast and resolution of the sample image. Results show that the contrast of single and few layer graphene crystals and structures can be enhanced by a factor of 4 compared to values commonly achieved with transparent substrates using optical reflection microscopy lacking refractive index optimization. (C) 2013 Optical Society of America
引用
收藏
页码:12934 / 12941
页数:8
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