Nanopores in GaN by electrochemical anodization in hydrofluoric acid: Formation and mechanism

被引:127
作者
Chen, Danti [1 ]
Xiao, Hongdi [1 ,2 ]
Han, Jung [1 ]
机构
[1] Yale Univ, Dept Elect Engn, New Haven, CT 06520 USA
[2] Shandong Univ, Sch Phys, Jinan 250100, Peoples R China
基金
美国国家科学基金会;
关键词
POROUS SILICON FORMATION; PORE FORMATION; MORPHOLOGY; GROWTH;
D O I
10.1063/1.4752259
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report the use of hydrofluoric acid (HF) as an electrolyte in etching and porosifying GaN. HF is found to be effective in rendering a wide range of nanoporous morphology, from curved branches to highly parallel straight pores. Under suitable conditions, the porosification proceeds at a rate greater than 100 mu m/min. To elucidate the etching mechanism, cyclic voltammetry is performed, together with a parametric mapping of electrolysis variables such as the doping of GaN, the concentration of HF electrolyte, and the anodization voltage. We demonstrate that the formation of nanoporous structures is largely due to the local breakdown of the reverse-biased semiconductor junction. A quantitative agreement between the estimated width of space-charge region and the observed variation in morphology lends support to a depletion layer model developed previously in the etching of porous-Si. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4752259]
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页数:5
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